Parag K. Lala digital circuits, logic circuit testing, VLSI, fault detection, design- for-testability, chapter also discusses test generation for sequential circuits. Digital circuit testing and testability by Parag K. Lala, , Academic Press edition, in English. Get this from a library! Digital circuit testing and testability. [Parag K Lala].
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The E-mail Address es you entered is are not in a valid format. Each chapter covers a different aspect or technological component of fault-tolerant system design, and this book is an excellent compilation of up-to-date information in an area where such a book is needed. Finding libraries that hold this item Nishwin rated it really liked it Feb 10, History Created April 1, 6 revisions Download catalog record: Mustaq Ahmad rated it liked it Feb 03, Are you sure you want to remove Digital circuit testing and testability from your list?
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Don’t have an account? Digital Circuit Testing and Testability is an easy to use introduction to the practices and techniques in this field.
Reliability is one of the most important considerations in computer design, and an important part of creating a computer is designing one that is tolerant of faults.
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Digital circuit testing and testability (Book, ) 
Lala writes in a user-friendly and tutorial style, making the Please re-enter recipient e-mail address es. Sep 25, Uttam rated it liked it. Faults in Digital Circuits — Ch. Selected pages Title Page.
Digital circuit testing and testability
English View all editions and formats Summary:. Please create a new list with a new name; move some items to a new or existing list; or delete some items. See 2 questions about Digital Circuit Testing and Testability…. Roket Raja rated it really liked it Oct 25, Malathi rated it it was amazing Dec 06, Classifications Dewey Decimal Class Reviews User-contributed reviews Add a review and share your thoughts with other readers.
WorldCat is the world’s largest library catalog, helping you find library materials online. Trivia About Digital Circuit T Books by Parag K. Digital circuit testing and testability Parag K. Create lists, bibliographies and reviews: Gomathy K rated it liked it Sep 19, The Physical Object Pagination xii, p. Advanced Search Find a Library. Please enter the message. It presents coverage of self checking logic design at the gate and the transistor level; discusses the latest techniques for testing state machines; and includes detailed coverage of memory testing.
User Review – Flag as inappropriate very useful book for testing of vlsi. Please select Ok if you would like to proceed with this request anyway. The E-mail Address es field is required. Neela rated it liked it Dec 04, Testable Memory Design — App.
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